[Gordon Haggott Beckhart, Patrick Rooney Conarro, Kevin James Harrell, Michael Charles Krause, Kamran Michael Farivar-Sadri] ,Colorado Springs,CO,;,Cascade,CO,;,Woodland Park,CO,;,Colorado Springs,CO,;,Colorado Springs,CO, An electronic level ( 10 ) has a rigid flat disk ( 12 ). An electronic level sensor ( 14 ) is attached to the rigid flat disk ( 12 ). An electronic display ( 20 ) is electrically connected to the electronic level sensor ( 14 ).

[Gordon Haggott Beckhart, Patrick Rooney Conarro, Kevin James Harrell, Kamran Michael Farivar-Sadri] US CO Colorado Springs A semiconductor load port alignment device has a housing with a registration face and an alignment measurement face. A plurality of sensors are contained in the housing near the alignment measurement face. A processor is connected to the plurality of sensors.

[Gordon Haggott Beckhart, Patrick Rooney Conarro, Kevin James Harrell, Michael Charles Krause, Kamran Michael Farivar-Sadri] ,Colorado Springs,CO,;,Green Mountain Falls,CO,;,Woodland Park,CO,;,Colorado Springs,CO,;,Colorado Springs,CO, A robot alignment system ( 10 ) includes a sensor system ( 12 ). The sensor system ( 12 ) is designed to attach to an end effector of a robot arm ( 14 ). A rough alignment target ( 16 ) is attached to a work station. A fine alignment target ( 22 ) is placed on a work surface of the work station. The sensor system ( 12 ) first determines the rough alignment target ( 16 ). The robot arm ( 14 ) is then moved to detect the fine alignment target ( 22 ).

[Gordon Haggott Beckhart, Patrick Rooney Conarro, Kevin James Harrell, Michael Charles Krause, Kamran Michael Farivar-Sadri] US CO Colorado Springs A robot alignment system (10) includes a sensor system (12). The sensor system (12) is designed to attach to an end effector of a robot arm (14). A rough alignment target (16) is attached to a work station. A fine alignment target (22) is placed on a work surface of the work station. The sensor system (12) first determines the rough alignment target (16). The robot arm (14) is then moved to detect the fine alignment target (22).